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Cikakken atomic makamashi microscope AFM5500M
AFM5500M ne mai mahimmanci inganta aiki da kuma auna daidaito, sanye da cikakken atomic iko microscope tare da 4 inch atomic mota bench. Na'urorin sun
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Cikakken atomic makamashi microscope AFM5500M
AFM5500M ne mai mahimmanci inganta aiki da kuma auna daidaito, sanye da cikakken atomic iko microscope tare da 4 inch atomic mota bench. Na'urorin suna ba da cikakken aiki na atomatik a kan hanyoyin maye gurbin hannu, laser biyu, saitunan sigogin gwaji da sauransu. Sabon na'urar bincike mai daidaito da ƙananan hayaniya na 3-axis yana ba da damar inganta daidaiton ma'auni sosai. Hakanan, raba samfurin samfurin ta hanyar SEM-AFM yana ba da sauƙi don yin lura da nazarin juna na hangen nesa ɗaya.
- Bayani na icon
Kamfanin samarwa: Hitachi High-tech Science
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siffofi
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sigogi
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Movie
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Aikace-aikacen Data
siffofi
1. Aikin sarrafa kansa
- Babban haɗin aikin sarrafa kansa yana bin ganowa mai inganci
- Rage mutum aiki kuskure a ganowa
4 inch atomatik motor tebur
Auto maye gurbin arm aiki
2. Amintacce
Kurar da kuskure daga inji dalilai
- Babban kewayon mataki scan
- Amfani da na'urar daukar hoto mai daukar hoto mai daukar hoto mai daukar hoto mai daukar hoto mai daukar hoto mai daukar hoto, yawanci ana samun bayanan jirgin sama ta hanyar gyaran software. Duk da haka, amfani da hanyar gyara software ba zai iya kawar da tasirin motsin arc na mai bincike gaba ɗaya ba, kuma sau da yawa ana samun tasirin karkatarwa a kan hoton.
AFM5500M yana da sabon na'urar bincike ta kwance da aka haɓaka don yin daidai gwaji ba tare da tasirin motsi na arc ba.
Sample ：Amorphous silicon thin film on a silicon substrate
- High precision angular ma'auni
- Na'urar bincike da aka yi amfani da ita ta hanyar microscope na atomic na yau da kullun, yana faruwa a lokacin da yake tsaye (crosstalk). Wannan shine dalilin kai tsaye da ke haifar da kuskuren siffar hoto a cikin yanayin kwance.
Sabuwar na'urar bincike da ke cikin AFM5500M ba ta da karkata (crosstalk) a tsaye, don samun hoton da ya dace ba tare da karkatarwa ba.
Sample : Textured-structure solar battery(having symmetrical structure due to its crystal orientation.)
- * Lokacin amfani da AFM5100N (bude zobe iko)
3. Haɗuwa
Kuskuren haɗuwa da sauran hanyoyin binciken ganowa
Ta hanyar raba daidaitawa samfurin tebur na SEM-AFM, za a iya cimma saurin lura da binciken samfurin a cikin hangen nesa guda, siffar farfajiyar samfurin, tsarin, abubuwan da ke ciki, halayen jiki da sauransu.
SEM-AFM lura misali a cikin wannan hangen nesa (samfurin: graphene / SiO2）
The ovrlay images createed by using AZblend Ver.2.1, ASTRON Inc.
Hoton da ke sama shine bayanan aikace-aikace na siffofin siffofin AFM5500M (AFM kama) da kuma damar siffofin (KFM kama) da kuma SEM image overlay.
- Ana iya yanke hukunci ta hanyar nazarin hoton AFM, SEM bambanci yana nuna ƙananan ƙananan ƙananan ƙananan ƙananan ƙananan ƙananan ƙananan ƙananan ƙananan ƙananan ƙananan ƙananan ƙananan ƙananan ƙananan.
- Daban-daban na layers na graphene yana haifar da bambanci a cikin ƙarfin farfajiyar (aikin aiki).
- SEM image bambanci daban-daban, kuma za a iya samun dalilin ta hanyar SPM ta high daidaito 3D geometry da kuma jiki halaye nazarin.
Shirye-shiryen haɗin gwiwa tare da sauran microscopes da kayan aikin bincike a nan gaba.
sigogi
| Motar | Auto daidaito motor tebur Max duba kewayon: 100 mm (4 inches) a duk faɗin Mota tebur motsi kewayon: XY ± 50 mm, Z ≥ 21 mm Mafi ƙarancin mataki: XY 2 μm, Z 0.04 μm |
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| Max samfurin size | Diamita: 100 mm, kauri: 20 mm Samfurin nauyi: 2 kg |
| Scan kewayon | 200 µm x 200 µm x 15 µm (XY: Kula da madauki / Z: Kula da firikwensin) |
| RMS amo matakin * | Kasa da 0.04 nm (yanayin ƙuduri mai girma) |
| Sake daidaito* | XY: ≤15 nm (3σ, daidaitaccen nisan da aka auna 10 μm) / Z: ≤1 nm (3σ, daidaitaccen zurfin da aka auna 100 nm) |
| XY daidai kusurwa | ±0.5° |
| BOW* | kasa da 2 nm/50 µm |
| Hanyar Ganowa | Laser ganowa (low tsangwama gani tsarin) |
| Microscope na gani | Ƙarin girma: x1 ~ x7 Bayani kewayon: 910 μm x 650 μm ~ 130 μm x 90 μm Nuni girma: x465 ~ x3,255 (nuni mai inci 27) |
| Shock Station | Teburin aiki mai sauƙaƙe 500 mm (W) x 600 mm (D) x 84 mm (H), kimanin 28 kg |
| Anti-sauti Cover | 750 mm(W) x 877 mm (D) x 1400 mm(H)、 kimanin 237 kg |
| Girma・Nauyi | 400 mm（W） x 526 mm（D） x 550 mm（H）、 kimanin 90 kg |
- * sigogi dangane da na'urar saiti da kuma sanya yanayi.
| OS | Windows7 |
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| RealTune ® II | Ta atomatik daidaita arm amplitude, lamba, scan kudi da kuma siginar feedback |
| Aiki Screen | Ayyukan kewayawa na aiki, Ayyukan nuna taga da yawa (gwaji / bincike), Ayyukan overlay na hoto na 3D, Ayyukan nuna kewayon bincike / auna CV, Ayyukan nazarin sarrafa bayanai, Ayyukan kimantawa na bincike |
| X, Y, Z bincike tuki ƙarfin lantarki | 0～150 V |
| Lokaci-lokaci gwaji (pixel maki) | 4 hotuna (mafi girma 2,048 x 2,048) 2 hotuna (mafi girma 4,096 x 4,096) |
| Rectangular scan | 2:1, 4:1, 8:1, 16:1, 32:1, 64:1, 128:1, 256:1, 512:1, 1024:1 |
| Software na bincike | 3D nuni aiki, roughness bincike, sashe bincike, matsakaicin sashe bincike |
| Aikin sarrafa kansa | Auto maye gurbin bracket, auto laser biyu-biyu tsakiya |
| Girma・Nauyi | 340 mm（W） x 503 mm（D） x 550 mm（H）、 kimanin 34 kg |
| wutar lantarki | AC100 ~ 240 V ± 10% AC |
| Wayin gwaji | Standard Fitting: AFM, DFM, PM (Phase), FFM Zaɓuɓɓuka: SIS siffar, SIS jiki halaye, LM-FFM、VE-AFM、Adhesion、Current、Pico-Current、SSRM、PRM、KFM、EFM（AC）、EFM（DC）、MFM |
- * WINDOWS alamar kasuwanci ce ta Microsoft Corporation ta Amurka a Amurka da ƙasashe waje.
- * RealTune alamar kasuwanci ce ta Hitachi High Tech a Japan, Amurka da Turai.
| Samfurin Hitachi SEM mai amfani | SU8240, SU8230 (nau'in H36 mm), SU8220 (nau'in H29 mm) |
|---|---|
| Samfurin tebur size | 41 mm（W） x 28 mm（D） x 16 mm （H） |
| Max samfurin size | Φ20 mm x 7 mm |
| Matsakaicin daidaito | ± 10 μm (AFM zuwa matsakaicin daidaito) |
Movie
Aikace-aikacen Data
- SEM-SPM raba hanyar daidaitawa da wannan hangen nesa lura da graphene / SiO2(Tsarin PDF, 750kBytes)
Aikace-aikacen Data
Gabatar da aikace-aikace data na bincike bincike microscope.
Bayani
Bayani ka'idodin da kuma daban-daban jihohi ka'idodin kamar Scan Tunnel Microscope (STM) da kuma Atomic Power Microscope (AFM).
Tarihi da Ci gaban SPM
Bayani tarihin da ci gaban mu bincike bincike microscope da kuma mu na'urori. (Global site)
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